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10
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Magazine Name
:
Ieee Design And Test Of Computers
Year :
1995
Volume number :
12
Issue:
03
Guest Editor'S Indtroductio: Accelerating The Pace Of R&D In Asia.
(Article)
Subject
:
Author:
Teruhiko Tamada
page:
12 -
13
Identifying Untestable Faults In Sequential Circuits.
(Article)
Subject
:
Author:
Jwu E Chen Hsing-Chung Liang
page:
14 -
23
Modeling Fire Detecor Signals By Means Of System Identification Techniques
(Article)
Subject
:
Introduction
Author:
T. D Grozdic
page:
1801 -
1806
Concurrent Error Detection Using Monitoring Machines.
(Article)
Subject
:
Author:
Sunil D Sherlekar Rubin A Parekhji G Venkatesh
page:
24 -
33
Localizing Multiple Faults In A Protocol Implementation.
(Article)
Subject
:
Author:
Yoshiaki Kakuda Hideki Yukitomo Shinji Kusumoto
page:
34 -
43
Multiple Fault Diagnosis By Sensitizing Input Pairs.
(Article)
Subject
:
Author:
Nobuhiro Yanagida Hiroshi Takahashi
page:
44 -
52
Plug-And-Play Iddq Testing For Test Fixture
(Article)
Subject
:
Author:
Alan Hales Keith Baker
page:
53 -
61
Achieving Iddq Issq Production Testing With Quic-Mon.
(Article)
Subject
:
Author:
Kenneth M Wallquist
page:
62 -
69
Profile-Driven Behavioral Synthesis For Low-Power Vlsi Systems.
(Article)
Subject
:
Author:
Ranga Vemuri Srinivas Katkoori Nand Kumar
page:
70 -
85
Industrial Bist Of Embedded Rams.
(Article)
Subject
:
Author:
Paolo Camurati Paolo Prinetto Matteo Sonza Reorda
page:
86 -
95
